Field Ion Microscopy
   HOME

TheInfoList



OR:

The Field ion microscope (FIM) was invented by Müller in 1951. It is a type of
microscope A microscope () is a laboratory instrument used to examine objects that are too small to be seen by the naked eye. Microscopy is the science of investigating small objects and structures using a microscope. Microscopic means being invisibl ...
that can be used to image the arrangement of
atom Every atom is composed of a nucleus and one or more electrons bound to the nucleus. The nucleus is made of one or more protons and a number of neutrons. Only the most common variety of hydrogen has no neutrons. Every solid, liquid, gas, and ...
s at the surface of a sharp metal tip. On October 11, 1955, Erwin Müller and his Ph.D. student, Kanwar Bahadur (Pennsylvania State University) observed individual tungsten atoms on the surface of a sharply pointed tungsten tip by cooling it to 21 K and employing helium as the imaging gas. Müller & Bahadur were the first persons to observe individual atoms directly.


Introduction

In FIM, a sharp (<50 nm tip radius) metal tip is produced and placed in an
ultra high vacuum Ultra-high vacuum (UHV) is the vacuum regime characterised by pressures lower than about . UHV conditions are created by pumping the gas out of a UHV chamber. At these low pressures the mean free path of a gas molecule is greater than approximately ...
chamber, which is backfilled with an imaging gas such as
helium Helium (from el, ἥλιος, helios, lit=sun) is a chemical element with the symbol He and atomic number 2. It is a colorless, odorless, tasteless, non-toxic, inert, monatomic gas and the first in the noble gas group in the periodic table. ...
or neon. The tip is cooled to cryogenic temperatures (20–100 K). A positive
voltage Voltage, also known as electric pressure, electric tension, or (electric) potential difference, is the difference in electric potential between two points. In a static electric field, it corresponds to the work needed per unit of charge to m ...
of 5 to 10 kilo
volt The volt (symbol: V) is the unit of electric potential, electric potential difference (voltage), and electromotive force in the International System of Units (SI). It is named after the Italian physicist Alessandro Volta (1745–1827). Defi ...
s is applied to the tip. Gas atoms
adsorbed Adsorption is the adhesion of atoms, ions or molecules from a gas, liquid or dissolved solid to a surface. This process creates a film of the ''adsorbate'' on the surface of the ''adsorbent''. This process differs from absorption, in which a ...
on the tip are ionized by the strong electric field in the vicinity of the tip (thus, "field ionization"), becoming positively charged and being repelled from the tip. The curvature of the surface near the tip causes a natural magnification —
ion An ion () is an atom or molecule with a net electrical charge. The charge of an electron is considered to be negative by convention and this charge is equal and opposite to the charge of a proton, which is considered to be positive by conve ...
s are repelled in a direction roughly perpendicular to the surface (a "point projection" effect). A detector is placed so as to collect these repelled ions; the image formed from all the collected ions can be of sufficient resolution to image individual atoms on the tip surface. Unlike conventional microscopes, where the spatial resolution is limited by the wavelength of the particles which are used for imaging, the FIM is a projection type microscope with atomic resolution and an approximate magnification of a few million times.


Design, limitations and applications

FIM like Field Emission Microscopy (FEM) consists of a sharp sample tip and a fluorescent screen (now replaced by a multichannel plate) as the key elements. However, there are some essential differences as follows: #The tip potential is positive. #The chamber is filled with an imaging gas (typically, He or Ne at 10−5 to 10−3 Torr). #The tip is cooled to low temperatures (~20-80K). Like FEM, the field strength at the tip apex is typically a few V/ Å. The experimental set-up and image formation in FIM is illustrated in the accompanying figures. In FIM the presence of a strong field is critical. The imaging gas atoms (He, Ne) near the tip are polarized by the field and since the field is non-uniform the polarized atoms are attracted towards the tip surface. The imaging atoms then lose their
kinetic energy In physics, the kinetic energy of an object is the energy that it possesses due to its motion. It is defined as the work needed to accelerate a body of a given mass from rest to its stated velocity. Having gained this energy during its acc ...
performing a series of hops and accommodate to the tip temperature. Eventually, the imaging atoms are ionized by tunneling electrons into the surface and the resulting positive ions are accelerated along the
field line A field line is a graphical visual aid for visualizing vector fields. It consists of an imaginary directed line which is tangent to the field vector at each point along its length. A diagram showing a representative set of neighboring field ...
s to the screen to form a highly magnified image of the sample tip. In FIM, the
ionization Ionization, or Ionisation is the process by which an atom or a molecule acquires a negative or positive charge by gaining or losing electrons, often in conjunction with other chemical changes. The resulting electrically charged atom or molecul ...
takes place close to the tip, where the field is strongest. The electron that tunnels from the atom is picked up by the tip. There is a critical distance, xc, at which the tunneling probability is a maximum. This distance is typically about 0.4 nm. The very high spatial resolution and high contrast for features on the atomic scale arises from the fact that the electric field is enhanced in the vicinity of the surface atoms because of the higher local curvature. The resolution of FIM is limited by the thermal velocity of the imaging ion. Resolution of the order of 1Å (atomic resolution) can be achieved by effective cooling of the tip. Application of FIM, like FEM, is limited by the materials which can be fabricated in the shape of a sharp tip, can be used in an ultra high vacuum (UHV) environment, and can tolerate the high
electrostatic fields An electric field (sometimes E-field) is the field (physics), physical field that surrounds electrically charged particles and exerts force on all other charged particles in the field, either attracting or repelling them. It also refers to the ...
. For these reasons,
refractory metals Refractory metals are a class of metals that are extraordinarily resistant to heat and wear. The expression is mostly used in the context of materials science, metallurgy and engineering. The definition of which elements belong to this group dif ...
with high melting temperature (e.g. W, Mo, Pt, Ir) are conventional objects for FIM experiments. Metal tips for FEM and FIM are prepared by
electropolishing Electropolishing, also known as electrochemical polishing, anodic polishing, or electrolytic polishing (especially in the metallography field), is an electrochemical process that removes material from a metallic workpiece, reducing the surface roug ...
(electrochemical polishing) of thin wires. However, these tips usually contain many
asperities In materials science, asperity, defined as "unevenness of surface, roughness, ruggedness" (from the Latin ''asper''—"rough"), has implications (for example) in physics and seismology. Smooth surfaces, even those polished to a mirror finish, a ...
. The final preparation procedure involves the in situ removal of these asperities by field evaporation just by raising the tip voltage. Field evaporation is a field induced process which involves the removal of atoms from the surface itself at very high field strengths and typically occurs in the range 2-5 V/Å. The effect of the field in this case is to reduce the effective binding energy of the atom to the surface and to give, in effect, a greatly increased evaporation rate relative to that expected at that temperature at zero fields. This process is self-regulating since the atoms that are at positions of high local curvature, such as adatoms or ledge atoms, are removed preferentially. The tips used in FIM is sharper (tip radius is 100~300 Å) compared to those used in FEM experiments (tip radius ~1000 Å). FIM has been used to study dynamical behavior of surfaces and the behavior of adatoms on surfaces. The problems studied include
adsorption Adsorption is the adhesion of atoms, ions or molecules from a gas, liquid or dissolved solid to a surface. This process creates a film of the ''adsorbate'' on the surface of the ''adsorbent''. This process differs from absorption, in which ...
-
desorption Desorption is the physical process where a previously adsorbed substance is released from a surface. This happens when a molecule gains enough energy to overcome the activation barrier of the bounding energy that keeps it in the surface. There ...
phenomena, surface diffusion of adatoms and clusters, adatom-adatom interactions, step motion, equilibrium crystal shape, etc. However, there is the possibility of the results being affected by the limited surface area (i.e. edge effects) and by the presence of large electric field.


See also

* Atom probe *
Electron microscope An electron microscope is a microscope that uses a beam of accelerated electrons as a source of illumination. As the wavelength of an electron can be up to 100,000 times shorter than that of visible light photons, electron microscopes have a hi ...
* Field emission microscopy *
List of surface analysis methods This is a list of analysis methods used in materials science. Analysis methods are listed by their acronym, if one exists. Symbols * μSR – see muon spin spectroscopy * χ – see magnetic susceptibility A * AAS – Atomic absorption spec ...


References

* K.Oura, V.G.Lifshits, A.ASaranin, A.V.Zotov and M.Katayama, Surface Science – An Introduction, (Springer-Verlag Berlin Heidelberg 2003). * John B. Hudson, Surface Science – An Introduction, BUTTERWORTH-Heinemann 1992.


External links


Northwestern University Center for Atom-Probe Tomography
*
Microscope Parts
need to know.


Further reading

* * {{Cite journal , last1 = Muller , first1 = E. W. , title = Field Ion Microscopy , doi = 10.1126/science.149.3684.591 , journal = Science , volume = 149 , issue = 3684 , pages = 591–601 , year = 1965 , pmid = 17747566, jstor = 1716643, bibcode = 1965Sci...149..591M Microscopes Scientific techniques